Joe Kelly's Advanced Production Testing of RF, SoC, and SiP Devices PDF

By Joe Kelly

That includes helpful enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its variety source bargains skilled engineers a finished knowing of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) creation trying out which are serious to their paintings related to semiconductor units. The booklet covers key size innovations for semiconductor equipment checking out and assists engineers in explaining those options to administration to assist cut back undertaking expense, time, and assets. in line with real-world event and choked with time-saving equations, this in-depth quantity bargains pros functional info on crucial themes that experience by no means been provided in one reference earlier than.

Show description

Read Online or Download Advanced Production Testing of RF, SoC, and SiP Devices PDF

Similar microwaves books

Frequency Synthesizers: From Concept to Product (Artech by Alexander Chenakin PDF

A frequency synthesizer is an digital process for producing any of a number frequencies from a unmarried fastened oscillator. they're present in glossy units like radio receivers, cell phones, and GPS platforms. This complete source bargains RF and microwave engineers an intensive review of either well-established and lately built frequency synthesizer layout options.

Read e-book online Microwave and RF Product Applications (Principles and PDF

The sphere of microwave engineering has gone through a thorough transformation lately, as advertisement instant endeavors overtook safety and govt paintings. the trendy microwave and RF engineer needs to be acquainted with purchaser expectancies, industry tendencies, production applied sciences, and manufacturing facility types to a point that's extraordinary.

Download PDF by Hiroaki Kogure: Introduction to RF Design Using EM Simulators (Artech House

Richly illustrated and written in an easy-to-comprehend kind, this hugely obtainable source presents beginner engineers and engineering scholars with a superb creation to using electromagnetics (EM) simulation in RF layout. Engineers methods to use EM software program to layout microwave circuits and to behavior sign integrity research of high-speed electronic circuits.

Digital Microwave Communication: Engineering Point-to-Point by George Kizer PDF

The 1st booklet to hide all engineering facets of microwave conversation course layout for the electronic ageFixed point-to-point microwave platforms offer moderate-capacity electronic transmission among well-defined destinations. hottest in events the place fiber optics or satellite tv for pc conversation is impractical, it truly is universal for mobile or desktops website interconnectivity the place electronic connectivity is required yet now not economically to be had from different assets, and in deepest networks the place reliability is most crucial.

Extra resources for Advanced Production Testing of RF, SoC, and SiP Devices

Sample text

Therefore, S-parameters can be listed in a magnitude–phase notation or in real–imaginary notation. The more common way is to specify magnitude and phase. In RF and SoC testing, the phase is typically not of importance, and the test engineer concentrates only on the magnitude portion of the measurement. Because S-parameters are obtained by dividing two numbers of the same units (volts), S-parameters themselves do not have a unit. However, instead of simply showing S-parameters as a number without units we translate those ratios into a logarithmic scale and therefore talk about S-parameters in decibels (dB).

Other standard specific tests that require modulated signals are ACLR [commonly performed for code division multiple access (CDMA) devices], bit error rate tests (commonly performed on Bluetooth devices), or error vector magnitude (EVM), which is frequently measured on devices that use orthogonal frequency division modulation (OFDM) such as Worldwide Interoperability for Microwave Access (WiMAX). A device-specific test is a test that is not performed because it is required according to the IEEE specification, but performed by the vendor to guarantee correct design of the device.

RF (Gigahertz) ATE Production Testing On-Wafer: Options and Tradeoffs,” Proc. 1999 Int. , 1999, p. 388. , and R. Grewal, “Microwave Electronic Calibration: Transferring Standards Lab Accuracy to the Production Floor,” Microwave Journal, Vol. 37, No. 9, 1994, pp. 94–105. , “Techniques Optimize Calibration of PCB Fixtures and Probes,” Microwaves & RF, Vol. 34, No. 11, 1995, pp. 93–98. , “Error Models for Systems Measurement,” Microwave Journal, Vol. 22, No. 5, 1978, pp. 63–66. Concepts of Production Testing of RF, SoC, and SiP Devices 19 [7] Agilent Technologies, “Ultra Wideband Communication RF Measurements,” Application Note 1488, 2004.

Download PDF sample

Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly

by William

Rated 4.12 of 5 – based on 18 votes